Solution | Quantima Inductively Coupled Plasma Emission Spectrometer for Analysis of B Element in Silicon-Manganese Alloys
Release Date ：2025-03-24
For the analysis of B element in silicon-manganese alloys, the use of ICP-OES technology can provide high sensitivity and high resolution measurement results. Through accurate spectral analysis, the concentration of B element in silicon-manganese alloys can be accurately determined. This paper is based on the method of spectrometer analysis of B element in alloys in national standard YB/T4462-2015. This method uses the Quantima Inductively Coupled Plasma Emission Spectrometer (ICP-OES) of Dongyi Analysis‘s GBC brand for determination. It has the advantages of wide application range and convenient operation. It can be used for reference by relevant personnel. Attachment Download
| Application Field : | Release Date :2025-03-24 |
| Test Sample : | Test Parameters :petrochemical |
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Solution | Quantima Inductively Coupled Plasma Emission Spectrometer for Analysis of B Element in Silicon-Manganese Alloys
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